Department of Physics and Astronomy
Sonoma State University
Lecture: M W 1-1:50 pm, Stevenson 2079
Laboratory: W 2-4:50 pm, Salazar 2009B
Instructor: Dr. Hongtao Shi
Office: Darwin 300J
Office Hours: M 9:30 -11 am, Tu 4 - 5 pm, and by appointment
This is a lab based course, focusing on vacuum
technology, thin film fabrication and characterization. You
will prepare your own samples in the laboratory before characterizing them with
techniques mainly available in the Keck Microanalysis Laboratory in Salazar
2009B. This course is also an introduction to elemental identification and chemical
analysis using the energy dispersive X-ray (EDX) spectroscopy which is attached
to the scanning electron microscope (SEM).
Course Objectives: Students taking this laboratory course are required to demonstrate (a) knowledge, understanding and use of the principles of physics, (b) ability to design and/or conduct experiments and/or observations using physics principles and instrumentation, and (c) ability to properly analyze and interpret data and experimental uncertainty in order to make meaningful comparisons between experimental measurements or observation and theory. By the end of this course, it is to be expected that the students will have acquired an understanding of sputtering process, thermal evaporation, X-ray diffraction (XRD), surface analysis using scanning electron microscopy (SEM) and atomic force microscopy (AFM), Hall effect, and laser spectroscopy.
Text: No textbook is required
for this course. All course related material will be posted on the course website.
|Lab Reports: 25%|
|LabView Project: 15% (LabView Basics)|
|Course Grade||Percent||Course Grade||Percent||Course Grade||Percent|
1. Oliver C Wells, "Scanning electron microscopy," McGraw-Hill, 1974.
2. Richard Edward Lee, "Scanning electron microscopy and x-ray microanalysis," Prentice-Hall, 1993.
3. Joseph. I. Goldstein, D. E. Newbury, et al., Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, hardcover, Plenum Press, NY, Feb. 2003.
4. MyScope - training for advanced research
1. EDX: Advancing Materials Characterization
2. Microchemical Analysis Systems
3. EDX and WDX
4. EDX Testing and Analysis
1. X-ray Powder Diffraction
2. X-ray Diffraction and Synchrotron Light Source
1. Atomic Force Microscopy/Scanning Tunneling Microscopy 3, edited by Samuel H. Cohen, Marcia L. Lightbody, Kluwer Academic Publishers, 2002
2. Nanoscience Classroom
3. AFM Principle
Important University policies, such as add/drop classes, cheating and plagiarism, grade appeal procedures, etc. can be found here.
Email me if you have questions or comments.
Last updated: 05/09/2018