Physics 366: Intermediate Experimental Physics

Department of Physics and Astronomy

Sonoma State University

Spring 2018

Lecture: M W 1-1:50 pm, Stevenson 2079

Laboratory: W 2-4:50 pm, Salazar 2009B

Instructor: Dr. Hongtao Shi

Phone: 664-2013

Email: hongtao.shi@sonoma.edu

Office: Darwin 300J

Office Hours: M 9:30 -11 am, Tu 4 - 5 pm, and by appointment


Course Description: This is a lab based course, focusing on vacuum technology, thin film fabrication and characterization. You will prepare your own samples in the laboratory before characterizing them with techniques mainly available in the Keck Microanalysis Laboratory in Salazar 2009B. This course is also an introduction to elemental identification and chemical analysis using the energy dispersive X-ray (EDX) spectroscopy which is attached to the scanning electron microscope (SEM).

Course Objectives: Students taking this laboratory course are required to demonstrate (a) knowledge, understanding and use of the principles of physics, (b) ability to design and/or conduct experiments and/or observations using physics principles and instrumentation, and (c) ability to properly analyze and interpret data and experimental uncertainty in order to make meaningful comparisons between experimental measurements or observation and theory. By the end of this course, it is to be expected that the students will have acquired an understanding of sputtering process, thermal evaporation, X-ray diffraction (XRD), surface analysis using scanning electron microscopy (SEM) and atomic force microscopy (AFM), Hall effect, and laser spectroscopy.

Text: No textbook is required for this course. All course related material will be posted on the course website.

Laboratory Schedule

Grading Two Quizzes: 30%
  Presentation: 15%
  Lab Reports: 25%
  LabView Project: 15%
  Homework: 10%
  Attendance: 5%
Course Grade Percent Course Grade Percent Course Grade Percent
    A

93-100

A-

90-93

B+

87-90

B

83-87

B-

80-83

C+

77-80

C

73-77

C-

70-73

D+

67-70

D

63-67

D-

60-63

F

Below 60

       

References:

SEM

1. Oliver C Wells, "Scanning electron microscopy," McGraw-Hill, 1974.

2. Richard Edward Lee, "Scanning electron microscopy and x-ray microanalysis," Prentice-Hall, 1993.

3. Joseph. I. Goldstein, D. E. Newbury, et al., Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, hardcover, Plenum Press, NY, Feb. 2003.

4. MyScope - training for advanced research

EDX

1. EDX: Advancing Materials Characterization

2. Microchemical Analysis Systems

3. EDX and WDX

4. EDX Testing and Analysis

XRD

1. X-ray Powder Diffraction

2. X-ray Diffraction and Synchrotron Light Source

AFM

1. Atomic Force Microscopy/Scanning Tunneling Microscopy 3, edited by Samuel H. Cohen, Marcia L. Lightbody, Kluwer Academic Publishers, 2002

2. Nanoscience Classroom

3. AFM Principle


Disability: If you have a disability and need special consideration, please contact the Office of Disabled Student Services ( DSS ). Located in Salazar Hall, Room 1049, Phone 664-2677.

Important University policies, such as add/drop classes, cheating and plagiarism, grade appeal procedures, etc. can be found here.

Email me if you have questions or comments.

Last updated: 01/21/2018